Development of the Super High Angular Resolution Principle for X-ray imaging

Chen Zhang, chzhang@bao.ac.cn, National Astronomical Observatories, Chinese Academy of Sciences, China
Zhang Shuang Nan, zhangsn@ihep.ac.cn, Institute of High Energy Physics, Chinese Academy of Sciences

Abstract
Development of the Super High Angular Resolution Principle (SHARP) for coded-mask X-ray imaging is presented. The SHARP is theoretically demonstrated to be equivalent to a coded mask imaging system with a coding pattern comprised of diffraction-interference fringes of mask pattern. The SHARP is also demonstrated on an X-ray beam line facility. Potential ways to improve the angular resolution of SHARP and the capability to image distributed source are also shortly discussed.